Katalog Plus
Bibliothek der Frankfurt UAS
Bald neuer Katalog: sichern Sie sich schon vorab Ihre persönlichen Merklisten im Nutzerkonto: Anleitung.
Dieses Ergebnis aus IEEE Xplore Digital Library kann Gästen nicht angezeigt werden.  Login für vollen Zugriff.

Characterization of the Thermal Boundary Resistance of a Ga2O3/4H-SiC Composite Wafer

Title: Characterization of the Thermal Boundary Resistance of a Ga2O3/4H-SiC Composite Wafer
Authors: Song, Yiwen; Chatterjee, Bikramjit; McGray, Craig; Zhukovsky, Sarit; Leach, Jacob H.; Hess, Tina; Foley, Brian M.; Choi, Sukwon
Source: 2020 19th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2020 19th IEEE Intersociety Conference on. :154-157 Jul, 2020
Relation: 2020 19th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
Database: IEEE Xplore Digital Library