Investigating the Current Collapse Mechanisms of p-GaN Gate HEMTs by Different Passivation Dielectrics
| Title: | Investigating the Current Collapse Mechanisms of p-GaN Gate HEMTs by Different Passivation Dielectrics |
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| Authors: | Li, X.; Posthuma, N.; Bakeroot, B.; Liang, H.; You, S.; Wu, Z.; Zhao, M.; Groeseneken, G.; Decoutere, S. |
| Source: | IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 36(5):4927-4930 May, 2021 |
| Database: | IEEE Xplore Digital Library |