| Title: |
A new methodology for providing insight into manufacturing using KPIs based on SMKL (Smart Manufacturing Kaizen Level), utilizing industry standards (OPC UA, FDT, PLCopen and AutomationML) |
| Authors: |
Fujishima, Mitsushiro; Ueda, Shinobu; Yoneda, Hisato; Yoshizawa, Takashi; Ito, Akio; Takeuchi, Tetsuo; Chino, Shinichiro; Kitayama, Kenji; Ono, Toshio; Matsukuma, Takashi; Yoshida, Hiroshi; Okuda, Makoto; Kumagai, Kenji |
| Source: |
2020 59th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE) Instrument and Control Engineers of Japan (SICE), 2020 59th Annual Conference of the Society of. :1-6 Sep, 2020 |
| Relation: |
2020 59th Annual Conference of the Society of Instrument and Control Engineers of Japan (SICE) |
| Database: |
IEEE Xplore Digital Library |