| Title: |
Variation-Aware Test for Logic Interconnects using Neural Networks – A Case Study |
| Authors: |
Sprenger, Alexander; Sadeghi-Kohan, Somayeh; Reimer, Jan Dennis; Hellebrand, Sybille |
| Source: |
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020 IEEE International Symposium on. :1-6 Oct, 2020 |
| Relation: |
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
| Database: |
IEEE Xplore Digital Library |