Characterization and Architecture of Monolithic N⁺P-CMOS-SiPM Array for ToF Measurements
| Title: | Characterization and Architecture of Monolithic N⁺P-CMOS-SiPM Array for ToF Measurements |
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| Authors: | Eshkoli, A.; Nemirovsky, Y. |
| Source: | IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 70:1-9 2021 |
| Database: | IEEE Xplore Digital Library |