Impact of Structural and Process Variations on the Time-Dependent OFF-State Breakdown of p-GaN Power HEMTs
| Title: | Impact of Structural and Process Variations on the Time-Dependent OFF-State Breakdown of p-GaN Power HEMTs |
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| Authors: | Millesimo, M.; Posthuma, N.; Bakeroot, B.; Borga, M.; Decoutere, S.; Tallarico, A.N. |
| Source: | IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 21(1):57-63 Mar, 2021 |
| Database: | IEEE Xplore Digital Library |