Logic Fault Diagnosis of Hidden Delay Defects
| Title: | Logic Fault Diagnosis of Hidden Delay Defects |
|---|---|
| Authors: | Holst, Stefan; Kampmann, Matthias; Sprenger, Alexander; Reimer, Jan Dennis; Hellebrand, Sybille; Wunderlich, Hans-Joachim; Wen, Xiaoqing |
| Source: | 2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-10 Nov, 2020 |
| Relation: | 2020 IEEE International Test Conference (ITC) |
| Database: | IEEE Xplore Digital Library |