| Title: |
Characterization of THz-induced bias voltage modulation in an STM |
| Authors: |
Luo, Yang; Calzada, Jesus A.M.; Chen, Gong; Nguyen, Peter H.; Jelic, Vedran; Liu, Yu-Jui Ray; Mildenberger, Daniel J.; Simpson, Howe R.J.; Hegmann, Frank A. |
| Source: |
2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2020 45th International Conference on. :1-2 Nov, 2020 |
| Relation: |
2020 45th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz) |
| Database: |
IEEE Xplore Digital Library |