Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment
| Title: | Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment |
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| Authors: | Soderstrom, D.; Luza, L.M.; Kettunen, H.; Javanainen, A.; Farabolini, W.; Gilardi, A.; Coronetti, A.; Poivey, C.; Dilillo, L. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 68(5):716-723 May, 2021 |
| Database: | IEEE Xplore Digital Library |