Understanding the Role of Defects in Silicon Nitride-Based Resistive Switching Memories Through Oxygen Doping
| Title: | Understanding the Role of Defects in Silicon Nitride-Based Resistive Switching Memories Through Oxygen Doping |
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| Authors: | Vasileiadis, N.; Karakolis, P.; Mandylas, P.; Ioannou-Sougleridis, V.; Normand, P.; Perego, M.; Komninou, P.; Ntinas, V.; Fyrigos, I.; Karafyllidis, I.; Sirakoulis, G.C.; Dimitrakis, P. |
| Source: | IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 20:356-364 2021 |
| Database: | IEEE Xplore Digital Library |