Vertical stack reliability of GaN-on-Si buffers for low-voltage applications
| Title: | Vertical stack reliability of GaN-on-Si buffers for low-voltage applications |
|---|---|
| Authors: | Fabris, E.; Borga, M.; Posthuma, N.; Zhao, M.; De Jaeger, B.; You, S.; Decoutere, S.; Meneghini, M.; Meneghesso, G.; Zanoni, E. |
| Source: | 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-8 Mar, 2021 |
| Relation: | 2021 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |