| Title: |
Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies |
| Authors: |
Rzepa, G.; Karner, M.; Baumgartner, O.; Strof, G.; Schanovsky, F.; Mitterbauer, F.; Kernstock, C.; Karner, H.W.; Weckx, P.; Hellings, G.; Claes, D.; Wu, Z.; Xiang, Y.; Chiarella, T.; Parvais, B.; Mitard, J.; Franco, J.; Kaczer, B.; Linten, D.; Stanojevic, Z. |
| Source: |
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021 |
| Relation: |
2021 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |