| Title: |
Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors |
| Authors: |
Holden, Konner E. K.; Hall, Gavin D. R.; Cook, Michael; Kendrick, Chris; Pabst, Kaitlyn; Greenwood, Bruce; Daugherty, Robin; Gambino, Jeff P.; Allman, Derryl D. J. |
| Source: |
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-10 Mar, 2021 |
| Relation: |
2021 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |