A BSIM-Based Predictive Hot-Carrier Aging Compact Model
| Title: | A BSIM-Based Predictive Hot-Carrier Aging Compact Model |
|---|---|
| Authors: | Xiang, Y.; Tyaginov, S.; Vandemaele, M.; Wu, Z.; Franco, J.; Bury, E.; Truijen, B.; Parvais, B.; Linten, D.; Kaczer, B. |
| Source: | 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-9 Mar, 2021 |
| Relation: | 2021 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |