Reliable Strong PUF Enrollment and Operation with Temperature and Voltage Optimization
| Title: | Reliable Strong PUF Enrollment and Operation with Temperature and Voltage Optimization |
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| Authors: | Stangherlin, Kleber Hugo; Sachdev, Manoj |
| Source: | 2021 22nd International Symposium on Quality Electronic Design (ISQED) Quality Electronic Design (ISQED), 2021 22nd International Symposium on. :529-534 Apr, 2021 |
| Relation: | 2021 22nd International Symposium on Quality Electronic Design (ISQED) |
| Database: | IEEE Xplore Digital Library |