| Title: |
Quick Yield Impact Assessment Using Silicon-design Correlation to Address Design Systematics |
| Authors: |
Miao, Chenlong; Ryan, Deborah; Yin, Haizhou; Babu, Monisa Ramesh; Song, Shenghua; Chiu, Eric; Malik, Shobhit; Madhavan, Sriram; Wojtowecz, Michael; Lin, Peter; Wilkinson, William; Lim, CT; Venkatachalam, Panneerselvam |
| Source: |
2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2021 32nd Annual SEMI. :1-4 May, 2021 |
| Relation: |
2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) |
| Database: |
IEEE Xplore Digital Library |