TCAD Evaluation of the Substrate Bias Influence on the Carrier Transport of Ω-Gate Nanowire MOS Transistors with Ultra-Thin BOX
| Title: | TCAD Evaluation of the Substrate Bias Influence on the Carrier Transport of Ω-Gate Nanowire MOS Transistors with Ultra-Thin BOX |
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| Authors: | Bergamaschi, F. E.; Pavanello, M. A. |
| Source: | 2021 IEEE Latin America Electron Devices Conference (LAEDC) Electron Devices Conference (LAEDC), 2021 IEEE Latin America. :1-4 Apr, 2021 |
| Relation: | 2021 IEEE Latin America Electron Devices Conference (LAEDC) |
| Database: | IEEE Xplore Digital Library |