Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability
| Title: | Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability |
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| Authors: | Ravsher, T.; Sharifi, S. H.; Fantini, A.; Hody, H.; Witters, T.; Garbin, D.; Degraeve, R.; Afanas'ev, V.; van Houdt, J.; Goux, L.; Crotti, D.; Kar, G. |
| Source: | 2021 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2021 IEEE International. :1-4 May, 2021 |
| Relation: | 2021 IEEE International Memory Workshop (IMW) |
| Database: | IEEE Xplore Digital Library |