| Title: |
A Deep Learning-Based Approach for Quality Control and Defect Detection for Industrial Bagging Systems |
| Authors: |
Juncker, Mathieu; Khriss, Ismail; Brousseau, Jean; Pigeon, Steven; Darisse, Alexis; Lapointe, Billy |
| Source: |
2020 IEEE 19th International Conference on Cognitive Informatics & Cognitive Computing (ICCI*CC) Cognitive Informatics & Cognitive Computing (ICCI*CC), 2020 IEEE 19th International Conference on. :60-67 Sep, 2020 |
| Relation: |
2020 IEEE 19th International Conference on Cognitive Informatics & Cognitive Computing (ICCI*CC) |
| Database: |
IEEE Xplore Digital Library |