| Title: |
Intelligent Fault Analysis Decision Flow in Semiconductor Industry 4.0 Using Natural Language Processing with Deep Clustering |
| Authors: |
Ezukwoke, Kenneth; Toubakh, Houari; Hoayek, Anis; Batton-Hubert, Mireille; Boucher, Xavier; Gounet, Pascal |
| Source: |
2021 IEEE 17th International Conference on Automation Science and Engineering (CASE) Automation Science and Engineering (CASE), 2021 IEEE 17th International Conference on. :429-436 Aug, 2021 |
| Relation: |
2021 IEEE 17th International Conference on Automation Science and Engineering (CASE) |
| Database: |
IEEE Xplore Digital Library |