Efficient Functional In-Field Self-Test for Deep Learning Accelerators
| Title: | Efficient Functional In-Field Self-Test for Deep Learning Accelerators |
|---|---|
| Authors: | He, Yi; Uezono, Takumi; Li, Yanjing |
| Source: | 2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :93-102 Oct, 2021 |
| Relation: | 2021 IEEE International Test Conference (ITC) |
| Database: | IEEE Xplore Digital Library |