| Title: |
Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies : Invited paper |
| Authors: |
Franco, J.; Arimura, H.; de Marneffe, J.-F.; Vandooren, A.; Ragnarsson, L.-A; Wu, Z.; Claes, D.; Litta, E. Dentoni; Horiguchi, N.; Croes, K.; Linten, D.; Grasser, T.; Kaczer, B. |
| Source: |
2021 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2021 International Conference on. :1-4 Sep, 2021 |
| Relation: |
2021 International Conference on IC Design and Technology (ICICDT) |
| Database: |
IEEE Xplore Digital Library |