| Title: |
Impacts of Area-Dependent Defects on the Yield and Gate Oxide Reliability of SiC Power MOSFETs |
| Authors: |
Liu, Tianshi; Zhu, Shengnan; Jin, Michael; Shi, Limeng; White, Marvin H.; Agarwal, Anant K. |
| Source: |
2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Wide Bandgap Power Devices and Applications (WiPDA), 2021 IEEE 8th Workshop on. :5-8 Nov, 2021 |
| Relation: |
2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) |
| Database: |
IEEE Xplore Digital Library |