In Situ Transmission Electron Microscopy: Signal processing challenges and examples
| Title: | In Situ Transmission Electron Microscopy: Signal processing challenges and examples |
|---|---|
| Authors: | Kacher, J.; Xie, Y.; Voigt, S.P.; Zhu, S.; Yuchi, H.; Key, J.; Kalidindi, S.R. |
| Source: | IEEE Signal Processing Magazine IEEE Signal Process. Mag. Signal Processing Magazine, IEEE. 39(1):89-103 Jan, 2022 |
| Database: | IEEE Xplore Digital Library |