| Title: |
Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance |
| Authors: |
Fregonese, Sebastien; Mukherjee, Chhandak; Rucker, Holger; Chevalier, Pascal; Fischer, Gerhard; Celi, Didier; Deng, Marina; Couret, Marine; Marc, Francois; Maneux, Cristell; Zimmer, Thomas |
| Source: |
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2021 IEEE. :1-7 Dec, 2021 |
| Relation: |
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) |
| Database: |
IEEE Xplore Digital Library |