| Title: |
IEEE Std 4 "High voltage testing techniques": Past, present and future - IEEE/PES/PSIM High Voltage Testing Techniques Subcommittee Report |
| Authors: |
Larzelere, B.; Loving, K.; Daharsh, R.; Kise, J.; McComb, T.; Hanique, E.; Britton, J.; Molden, A.; Holst, B.; Coffeen, L.; McQuin, N.; Nichols, D.; Dufield, D.; Newnam, R.; Schneider, H.; Fitzpatrick, G.; Schneider, G.; Sebo, S.; Hildreth, J.; Schweickart, D.; Train, D.; Kremer, R.; Smith, M.; Wagenaar, L.; Kuffel, J.; So, E.; Ward, B.; McBride, J.; Tuli, S.; Yicheng Wang; Yixin Zhang; Hugh Zhu; Rickmann, J. |
| Source: |
2001 IEEE/PES Transmission and Distribution Conference and Exposition. Developing New Perspectives (Cat. No.01CH37294) Transmission and distribution Transmission and Distribution Conference and Exposition, 2001 IEEE/PES. 2:1064-1069 2001 |
| Relation: |
2001 IEEE/PES Transmission and Distribution Conference and Exposition |
| Database: |
IEEE Xplore Digital Library |