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Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash

Title: Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash
Authors: Gupta, V.; Besser, A.; Luza, L. Matana; Soderstrom, D.; Javanainen, A.; Kettunen, H.; Praks, J.; Voss, K.-O.; Virtanen, A.; Dilillo, L.
Source: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2019 19th European Conference on. :1-4 Sep, 2019
Relation: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
Database: IEEE Xplore Digital Library