| Title: |
Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors |
| Authors: |
Croes, Kristof; Simons, Veerle; Truijen, Brecht; Roussel, Philippe; Van Sever, Koen; Tsiara, Artemisia; Franco, Jacopo; Absil, Philippe |
| Source: |
2022 Optical Fiber Communications Conference and Exhibition (OFC) Optical Fiber Communications Conference and Exhibition (OFC), 2022. :1-3 Mar, 2022 |
| Relation: |
2022 Optical Fiber Communications Conference and Exhibition (OFC) |
| Database: |
IEEE Xplore Digital Library |