| Title: |
Bias Temperature Instability on SiC n- and p-MOSFETs for High Temperature CMOS Applications |
| Authors: |
Ashik, Emran K; Isukapati, Sundar B; Zhang, Hua; Liu, Tianshi; Gupta, Utsav; Morgan, Adam J; Misra, Veena; Sung, Woongje; Fayed, Ayman; Agarwal, Anant K.; Lee, Bongmook |
| Source: |
2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :3B.4-1-3B.4-8 Mar, 2022 |
| Relation: |
2022 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |