Impact of Aging Degradation on Heavy-Ion SEU Response of 28-nm UTBB FD-SOI Technology
| Title: | Impact of Aging Degradation on Heavy-Ion SEU Response of 28-nm UTBB FD-SOI Technology |
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| Authors: | Mounir Mahmoud, M.; Prinzie, J.; Soderstrom, D.; Niskanen, K.; Pouget, V.; Cathelin, A.; Clerc, S.; Leroux, P. |
| Source: | IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(8):1865-1875 Aug, 2022 |
| Database: | IEEE Xplore Digital Library |