Stack Type Detection Using Few-Shot Learning
| Title: | Stack Type Detection Using Few-Shot Learning |
|---|---|
| Authors: | Lin, Henry; George, Kiran |
| Source: | 2022 IEEE World Conference on Applied Intelligence and Computing (AIC) Applied Intelligence and Computing (AIC), 2022 IEEE World Conference on. :260-266 Jun, 2022 |
| Relation: | 2022 IEEE World Conference on Applied Intelligence and Computing (AIC) |
| Database: | IEEE Xplore Digital Library |