| Title: |
On-Chip Nano Pulse Test Element Group for Analysis of Synaptic Devices |
| Authors: |
Ryu, Tae-Gyu; Kim, Seong-Hyun; Song, Ki-Woo; Shin, Hyun-Jin; An, Yeong-Jin; Eadi, Sunil-Babu; Kwon, Hyuk-Min; Lee, Hi-Deok |
| Source: |
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-3 Mar, 2022 |
| Relation: |
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) |
| Database: |
IEEE Xplore Digital Library |