| Title: |
Characterization and Monitoring Platform for Single-Photon Avalanche Diodes in the Development of a Photon-to-Digital Converter Technology |
| Authors: |
Parent, Samuel; Vachon, Frederic; Gauthier, Valerie; Paquette, Alexandre; Deschamps, Jacob; Rossignol, Tommy; Arsenault, Philippe; Paulin, Caroline; Lemay, Joel; Roy, Nicolas; Cote, Maxime; Dupont, Denis; Martel, Stephane; Dautet, Henri; Charlebois, Serge A.; Pratte, Jean-Francois |
| Source: |
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-4 Mar, 2022 |
| Relation: |
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) |
| Database: |
IEEE Xplore Digital Library |