An Online Condition Monitoring Method for IGBT Gate Oxide Degradation Based on the Gate Current in Miller Plateau
| Title: | An Online Condition Monitoring Method for IGBT Gate Oxide Degradation Based on the Gate Current in Miller Plateau |
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| Authors: | Moazami, A.; Mohsenzade, S.; Akbari, K. |
| Source: | IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 70(9):9505-9514 Sep, 2023 |
| Database: | IEEE Xplore Digital Library |