| Title: |
III-V HBTs on 300 mm Si substrates using merged nano-ridges and its application in the study of impact of defects on DC and RF performance |
| Authors: |
Vais, A.; Yadav, S.; Mols, Y.; Vermeersch, B.; Kodandarama, K. V.; Baryshnikova, M.; Mannaert, G.; Alcotte, R.; Boccardi, G.; Wambacq, P.; Parvais, B.; Langer, R.; Kunert, B.; Collaert, N. |
| Source: |
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2022 - IEEE 52nd European. :261-264 Sep, 2022 |
| Relation: |
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) |
| Database: |
IEEE Xplore Digital Library |