AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development
| Title: | AI Assisted Interference Classification to Improve EMC Troubleshooting in Electronic System Development |
|---|---|
| Authors: | Maalouly, Jad; Hemker, Dennis; Hedayat, Christian; Ruckert, Christian; Kaufmann, Ivan; Olbrich, Marcel; Lange, Sven; Mathis, Harald |
| Source: | 2022 Kleinheubach Conference Kleinheubach Conference, 2022. :1-4 Sep, 2022 |
| Relation: | 2022 Kleinheubach Conference |
| Database: | IEEE Xplore Digital Library |