| Title: |
A Comparison of Ion Implantation at Room Temperature and Heated Ion Implantation on the Body Diode Degradation of Commercial 3.3 kV 4H-SiC Power MOSFETs |
| Authors: |
Qian, Jiashu; Liu, Tianshi; Soto, Jake; Al-Jassim, Mowafak M.; Stahlbush, Robert; Mahadik, Nadeemullah; Shi, Limeng; Jin, Michael; Agarwal, Anant K. |
| Source: |
2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) Wide Bandgap Power Devices & Applications (WiPDA), 2022 IEEE 9th Workshop on. :49-53 Nov, 2022 |
| Relation: |
2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) |
| Database: |
IEEE Xplore Digital Library |