| Title: |
Effects of Oxide Electric Field Stress on the Gate Oxide Reliability of Commercial SiC Power MOSFETs |
| Authors: |
Shi, Limeng; Liu, Tianshi; Zhu, Shengnan; Qian, Jiashu; Jin, Michael; Maddi, Hema Lata Rao; White, Marvin H.; Agarwal, Anant K. |
| Source: |
2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) Wide Bandgap Power Devices & Applications (WiPDA), 2022 IEEE 9th Workshop on. :45-48 Nov, 2022 |
| Relation: |
2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA) |
| Database: |
IEEE Xplore Digital Library |