On the Fitting and Improvement of RRAM Stanford-Based Model Parameters Using TiN/Ti/HfO2/W Experimental Data
| Title: | On the Fitting and Improvement of RRAM Stanford-Based Model Parameters Using TiN/Ti/HfO2/W Experimental Data |
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| Authors: | Mahboubi, V.; Arumi, D.; Gomez, A.; Rodriguez, R.; Manich, S. |
| Source: | 2022 37th Conference on Design of Circuits and Integrated Circuits (DCIS) Design of Circuits and Integrated Circuits (DCIS), 2022 37th Conference on. :01-06 Nov, 2022 |
| Relation: | 2022 37th Conference on Design of Circuits and Integrated Circuits (DCIS) |
| Database: | IEEE Xplore Digital Library |