Fault-coverage Maximizing March Tests for Memory Testing
| Title: | Fault-coverage Maximizing March Tests for Memory Testing |
|---|---|
| Authors: | Yun, Feng; Lin, Yunkun; Yunfei, Lou; Gao, Lei; Gera, Vaibhav; Li, Boxuan; Nekkanti, Vennela Chowdary; Pharande, Aditya Rajendra; Sheth, Kunal; Thommondru, Meghana; Ye, Guizhong; Gupta, Sandeep |
| Source: | 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :529-533 Sep, 2022 |
| Relation: | 2022 IEEE International Test Conference (ITC) |
| Database: | IEEE Xplore Digital Library |