| Contributors: |
Vermaas, Pieter E., Editor-in-ChiefAff1; Cressman, Darryl, Series EditorAff2; Doorn, Neelke, Series EditorAff3; Silva, Edison Renato, Series EditorAff4; Brey, Philip, Editorial Board MemberAff5; Bucciarelli, Louis, Editorial Board MemberAff6; Davis, Michael, Editorial Board MemberAff7; Feenberg, Andrew, Editorial Board MemberAff8; Floridi, Luciano, Editorial Board MemberAff9; Fudano, Jun, Editorial Board MemberAff10; Hansson, Sven Ove, Editorial Board MemberAff11; Hanks, Craig, Editorial Board MemberAff12; Hendricks, Vincent F., Editorial Board MemberAff13; Ihde, Don, Editorial Board MemberAff14; Koen, Billy Vaughn, Editorial Board MemberAff15; Kroes, Peter, Editorial Board MemberAff16; Lavelle, Sylvain, Editorial Board MemberAff17; Lynch, Michael, Editorial Board MemberAff18; Meijers, Anthonie W.M., Editorial Board MemberAff19; Michael, Duncan, Editorial Board MemberAff20; Mitcham, Carl, Editorial Board MemberAff21; Newberry, Byron, Editorial Board MemberAff22; Nissenbaum, Helen, Editorial Board MemberAff23; Nordmann, Alfred, Editorial Board MemberAff24; Pitt, Joseph C, Editorial Board MemberAff25; Sarewitz, Daniel, Editorial Board MemberAff26; Schmidt, Jon Alan, Editorial Board MemberAff27; Simons, Peter, Editorial Board MemberAff28; van den Hoven, Jeroen, Editorial Board MemberAff29; van der Poel, Ibo, Editorial Board MemberAff30; Weckert, John, Editorial Board MemberAff31; Fritzsche, Albrecht, editorAff32; Santa-María, Andrés, editorAff33 |