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Electrical Wafer Sorting: a Deep Learning Approach for Advanced Wafer Defect Map Evaluation

Title:	Electrical Wafer Sorting: a Deep Learning Approach for Advanced Wafer Defect Map Evaluation
Authors:	Fiore, Michele^{Aff17, Aff18}; Sitta, Alessandro^Aff17; Sequenzia, Gaetano^Aff18; Rundo, Francesco^Aff18; Calabretta, Michele^Aff17
Contributors:	Chaari, Fakher, Series Editor^Aff1; Gherardini, Francesco, Series Editor^{Aff2, Aff16}; Ivanov, Vitalii, Series Editor^Aff3; Haddar, Mohamed, Series Editor^Aff4; Cavas-Martínez, Francisco, Editorial Board Member^Aff5; di Mare, Francesca, Editorial Board Member^Aff6; Kwon, Young W., Editorial Board Member^Aff7; Tolio, Tullio A. M., Editorial Board Member^Aff8; Trojanowska, Justyna, Editorial Board Member^Aff9; Schmitt, Robert, Editorial Board Member^Aff10; Xu, Jinyang, Editorial Board Member^Aff11; Berselli, Giovanni, editor^Aff12; Andrisano, Angelo Oreste, editor^Aff13; Di Stefano, Paolo, editor^Aff14; Rizzi, Caterina, editor^Aff15
Source:	Design Tools and Methods in Industrial Engineering V : Proceedings of the Fifth International Conference on Design Tools and Methods in Industrial Engineering, ADM 2025, September 3–5, 2025, Genova, Italy, Volume 2. :181-189
Database:	Springer Nature eBooks