Fabrication of focused electron beam induced deposition tips for high-speed atomic force microscopy using benchtop scanning electron microscopy
| Title: | Fabrication of focused electron beam induced deposition tips for high-speed atomic force microscopy using benchtop scanning electron microscopy |
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| Authors: | Imamura, MotonoriAff1; Miyagi, AtsushiAff1; Perrino, Alma P.Aff1, Aff3; Scheuring, SimonAff1, Aff2, IDs41596026013693_cor1 |
| Source: | Nature Protocols: Recipes for Researchers. :1-22 |
| Database: | Springer Nature Journals |