Just-in-time defect prediction for mobile applications: using shallow or deep learning?
| Title: | Just-in-time defect prediction for mobile applications: using shallow or deep learning? |
|---|---|
| Authors: | van Dinter, RaymonAff1, Aff2; Catal, CagatayAff3, IDs11219023096291_cor2; Giray, GörkemAff4; Tekinerdogan, BedirAff1 |
| Source: | Software Quality Journal. 31(4):1281-1302 |
| Database: | Springer Nature Journals |