Electrode-engineering on HfO2-based RRAM for variability control and hardware security
| Title: | Electrode-engineering on HfO2-based RRAM for variability control and hardware security |
|---|---|
| Authors: | Mishra, MadhuramAff1, IDs1085402617194z_cor1; Eadi, Sunil BabuAff2; Goyal, Rajat KumarAff1; Kushwaha, PragyaAff2; Ranjan, PranayAff3; Negi, Devendra SinghAff1, Aff3; Agarwal, HarshitAff1, Aff4 |
| Source: | Journal of Materials Science: Materials in Electronics. 37(11) |
| Database: | Springer Nature Journals |