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Focused Ion Beam Scanning Electron Microscopy in Soil Science: New Approaches to Soil Structure Analysis

Title:	Focused Ion Beam Scanning Electron Microscopy in Soil Science: New Approaches to Soil Structure Analysis
Authors:	Tolstygin, K. D.^{Aff1, Aff2, IDS0147687425700802_cor1}; Romanenko, K. A.^{Aff2, IDS0147687425700802_cor2}; Korostylev, E. V.^{Aff3, IDS0147687425700802_cor3}; Parochkin, A. V.^{Aff3, IDS0147687425700802_cor4}; Skvortsova, E. B.^{Aff2, IDS0147687425700802_cor5}; Gerke, K. M.^{Aff3, Aff4, IDS0147687425700802_cor6}
Source:	Moscow University Soil Science Bulletin. 81(1):123-132
Database:	Springer Nature Journals