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- https://hal.science/hal-01639713 ; c. cances and p. omnes. springer, 200, 2017, springer proceedings in mathematics & statistics, 978-3-319-57393-9 (4)
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1
von C. Reliable ; Power Accelerated Demonstration ; Deployment Of ; et al.
http://www.energy.ca.gov/contracts/PON-13-502/00_PON-13-502_Application_Manual.pdf.
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2
von Pacioni, Elia ; Coman, Andrei C. ; Calvaresi, Davide ; et al.
IEEE Access ; volume 14, page 21148-21166 ; ISSN 2169-3536
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3
von Naoui, A. ; Charlet, I. ; Guerber, S. ; et al.
Proceedings of the 19th European Microwave Integrated Circuits Conference ; EuMIC 2024 - 19th European Microwave Integrated Circuits Conference ; https://hal.science/hal-04775589 ; EuMIC 2024 - 19th European Microwave Integrated Circuits Conference, Sep 2024, Paris, France. pp.218-221, ⟨10.23919/EuMIC61603.2024.10732726⟩ ; https://ieeexplore.ieee.org/document/10732726
Schlagworte: RF-switches; Phase change material (PCM); Germanium-Telluride (GeTe); Optical actuation; Infrared wavelength; [SPI]Engineering Sciences [physics]
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4
von Occello, O. ; Margalef-Rovira, M. ; Barragan, Manuel J. ; et al.
Proceedings of NEWCAS 2024 ; 2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS) ; https://hal.univ-grenoble-alpes.fr/hal-04734831 ; 2024 22nd IEEE Interregional NEWCAS Conference (NEWCAS), Jun 2024, Sherbrooke, Canada. pp.79 - 83, ⟨10.1109/newcas58973.2024.10666369⟩
Schlagworte: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
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5
von Claret, Francis ; Prasianakis, N. ; Baksay, Attila ; et al.
EISSN: 2813-3412 ; Frontiers in Nuclear Engineering ; https://hal.science/hal-04679659 ; Frontiers in Nuclear Engineering, 2024, 3, pp.1437714. ⟨10.3389/fnuen.2024.1437714⟩
Schlagworte: [SPI]Engineering Sciences [physics]
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6
von RELIABLE SOFTWARE TECHNOLOGIES CORP STERLING VA ; Michael, C. C. ; Bartie, Aron ; et al.
DTIC
Schlagworte: Computer Programming and Software; Computer Systems Management and Standards; Miscellaneous Detection and Detectors; COMPUTER PROGRAMS; INFORMATION SECURITY; INTRUSION DETECTION(COMPUTERS); SOFTWARE ENGINEERING; SURVIVABILITY; MODIFICATION; REPORTS; PROTOTYPES; CODING; MONITORS; RECORDS.; SOFTWARE MUTATION; PE62301E; WUAFRLF1664006; Text
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7
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9
von R. C. Read ; A Reliable ; Streaming Half-inch ; et al.
http://www.hpl.hp.com/hpjournal/pdfs/IssuePDFs/1988-06.pdf.
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10
von Gomez, Roderick A. ; Porras, David A. ; Oggier, Germán G. ; et al.
IEEE Journal of Emerging and Selected Topics in Power Electronics ; volume 12, issue 2, page 1324-1336 ; ISSN 2168-6777 2168-6785
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11
von Matthias C. M. Troffaes ; Gert Cooman ; Reliable In ; et al.
http://www.maths.dur.ac.uk/users/matthias.troffaes/preprint/2003troffaes+decooman_estim_abstract.pdf.
Schlagworte: imprecise Dirichlet model
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12
von A Reliable ; Streaming Half-lnch ; Tape Drive ; et al.
http://www.hparchive.com/Journals/HPJ-1988-06.pdf.
Schlagworte: 24 Appendix; Solving Nonlinear Least Squares Problems
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13
von Kiefer, Michael ; Hurst, Dale, F ; Stiller, Gabriele, P ; et al.
ISSN: 1867-1381.
Schlagworte: [PHYS.PHYS.PHYS-AO-PH]Physics [physics]/Physics [physics]/Atmospheric and Oceanic Physics [physics.ao-ph]
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14
von Kiefer, Michael ; Hurst, Dale, F ; Stiller, Gabriele, P ; et al.
EISSN: 1867-8610 ; Atmospheric Measurement Techniques Discussions ; https://insu.hal.science/insu-04080316 ; Atmospheric Measurement Techniques Discussions, In press, ⟨10.5194/amt-2023-86⟩
Schlagworte: [PHYS.PHYS.PHYS-AO-PH]Physics [physics]/Physics [physics]/Atmospheric and Oceanic Physics [physics.ao-ph]
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15
von Böttcher, Philipp C. ; Gorjão, Leonardo Rydin ; Witthaut, Dirk ; et al.
IEEE Access ; volume 11, page 119947-119958 ; ISSN 2169-3536
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16
von Reynolds, Robert, P ; Persaud, Jessica, H ; Volonakis, George ; et al.
ISSN: 0002-7863.
Schlagworte: Hybrid Tin Iodides; Hybrid Lead Iodides Viologens; Electronically Active Organics; Charge-Transfer; Infrared; Optoelectronics; Anomalous Band-bowing; Hybrid Lead Iodides; Viologens; Infrared Optoelectronics; [CHIM.MATE]Chemical Sciences/Material chemistry; [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat]
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17
von Taul, Mads Graungaard ; Pallo, Nathan ; Stillwell, Andrew ; et al.
IEEE Transactions on Power Electronics ; volume 36, issue 11, page 12292-12308 ; ISSN 0885-8993 1941-0107
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18
von Lé, João, E G ; Ferrari, Philippe ; Serrano, Ariana, L C ; et al.
23ème édition des Journées Nationales Microondes (JNM); https://hal.science/hal-05253249; 23ème édition des Journées Nationales Microondes (JNM), Jun 2024, Antibes Juan-Les-Pins, France
Schlagworte: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
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19
von Margalef-Rovira, Marc ; Saadi, Abdelhalim ; Vincent, L. ; et al.
ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-02899947 ; IEEE Transactions on Electron Devices, 2020, 67 (6), pp.2263-2269. ⟨10.1109/TED.2020.2989726⟩.
Schlagworte: PACS 8542; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
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20
von Deans, Zandra C. ; Allen, Stephanie ; Jenkins, Lucy ; et al.
Prenatal Diagnosis ; volume 39, issue 5, page 379-387 ; ISSN 0197-3851 1097-0223
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21
von Vuyyuru, Umamaheswararao ; Maiti, Suman ; Chakraborty, Chandan ; et al.
IEEE Transactions on Sustainable Energy ; volume 10, issue 1, page 127-136 ; ISSN 1949-3029 1949-3037
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22
von Ahusborde, Etienne ; Amaziane, Brahim ; Baksay, Attila ; et al.
https://hal.science/hal-03165686 ; [Technical Report] EURAD. 2020.
Schlagworte: [MATH.MATH-NA]Mathematics [math]/Numerical Analysis [math.NA]; [SPI]Engineering Sciences [physics]; [SPI.FLUID]Engineering Sciences [physics]/Reactive fluid environment; [SPI.MECA.MEMA]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanics of materials [physics.class-ph]
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23
von Chainais-Hillairet, C. ; Eymard, R. ; Fuhrmann, J. ; et al.
Finite Volumes for Complex Applications X ; https://hal.science/hal-04355555 ; Finite Volumes for Complex Applications X, Oct 2023, Strasbourg, France. pp.225-233, ⟨10.1007/978-3-031-40864-9_17⟩
Schlagworte: [MATH]Mathematics [math]
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24
von STANFORD UNIV CA CENTER FOR RELIABLE COMPUTING ; Iyer,Ravishankar K. ; Rossetti,David J. ; et al.
DTIC AND NTIS
Schlagworte: Computer Hardware; COMPUTERS; RELIABILITY(ELECTRONICS); MODELS; FAILURE; BEHAVIOR; CENTRAL PROCESSING UNITS; WORKLOAD; FAULT TOLERANT COMPUTING; FAILURE(ELECTRONICS).; Text
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25
von Nduka, Onyema S. ; Pal, Bikash C. ; Engineering and Physical Sciences Research Council ; et al.
IEEE Transactions on Sustainable Energy ; volume 9, issue 3, page 1384-1396 ; ISSN 1949-3029 1949-3037
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