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1
von Laurin, L. ; Baldo, M. ; Petroni, E. ; et al.
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-7 Mar, 2023
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2
von Redaelli, A. ; Gandolfo, A. ; Samanni, G. ; et al.
ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2021 - IEEE 51st European. :231-234 Sep, 2021
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3
von Longo, E. ; Markou, A. ; Felser, C. ; et al.
Adv. Funct. Mater. 2024, 2407968
Schlagworte: Condensed Matter - Materials Science
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4
von Redaelli, A. ; Gandolfo, A. ; Samanni, G. ; et al.
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 10:563-568 2022
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5
von Ghomi S. ; Martella C. ; Lee Y. ; et al.
Schlagworte: 2D material; conductive AFM; memristor; resistive switching; tellurene; tellurium
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6
von Ghomi, S ; Martella, C ; Lee, Y ; et al.
Schlagworte: 2D material; conductive AFM; memristor; resistive switching; tellurene; tellurium; info:eu-repo/semantics/article
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7
von Aureli, I. ; Ventrice, D. ; Codegoni, C. ; et al.
2007 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on. :268-271 Mar, 2007
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8
Schlagworte: ferromagnetic resonance; half-Heusler compound; spin pumping; spin-charge conversion; spintronic; info:eu-repo/semantics/article
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9
von Macis, S ; D'Arco, A ; Mosesso, L ; et al.
Schlagworte: metamaterial; photonic; plasmonics, PtTe; 2; topological material; info:eu-repo/semantics/article
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10
von Polignano, M.L. ; Mica, I. ; Ceresoli, M. ; et al.
In Solid State Electronics April 2015 106:68-77
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11
von Longo, E. ; Markou, A. ; Felser, C. ; et al.
Advanced Functional Materials
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12
von Russo, F. ; Moccia, G. ; Nardone, G. ; et al.
In Solid State Electronics January 2014 91:91-99
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13
von Martella, C ; Campi, D ; Tummala, P ; et al.
Schlagworte: 2D material; bending stiffne; interface adhesion; PTAS seeding promoter; strain; Settore PHYS-03/A - Fisica sperimentale della materia e applicazioni; Settore PHYS-04/A - Fisica teorica della materia, modelli, metodi matematici e applicazioni; info:eu-repo/semantics/article
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14
von Di Palma, V ; Pianalto, A ; Perego, M ; et al.
Schlagworte: atomic layer deposition; IrO; 2; neuroelectronic; pseudocapacitive; Settore PHYS-03/A - Fisica sperimentale della materia e applicazioni; Settore PHYS-04/A - Fisica teorica della materia, modelli, metodi matematici e applicazioni; info:eu-repo/semantics/article
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15
von Nutsch, A. ; Beckhoff, B. ; Bedana, G. ; et al.
AIP Conference Proceedings ; page 23-28
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16
von Polignano, M. L. ; Codegoni, D. ; Grasso, S. ; et al.
physica status solidi (a) ; volume 212, issue 3, page 495-505 ; ISSN 1862-6300
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17
von Codegoni, D. ; Colder, A. ; Croitoru, N. ; et al.
In Nuclear Inst. and Methods in Physics Research, B 2004 217(1):65-76
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18
von Mica, I. ; Polignano, M. L. ; Moreau, O. ; et al.
physica status solidi c ; volume 4, issue 8, page 2992-2996 ; ISSN 1862-6351 1610-1642
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19
von Codegoni, D. ; Carnevale, G.P. ; De Marco, C. ; et al.
In Materials Science & Engineering B 2005 124:349-353
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20
von Grazianetti C. ; De Rosa S. ; Martella C. ; et al.
Schlagworte: Al; (0001); DFT calculation; optical conductivity; silicene; silicon; Two-dimensional
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21
von Baraona, E. ; Pirola, R. ; Lieber, C. S. ; et al.
Pharmacological Control of Lipid Metabolism : Proceedings of the Fourth International Symposium on Drugs Affecting Lipid Metabolism held in Philadelphia, Pennsylvania, September 8–11, 1971. 26:273-334
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22
von Martella, Christian ; Campi, Davide ; Tummala, Pinaka Pani ; et al.
Schlagworte: 2D material; bending stiffne; interface adhesion; PTAS seeding promoter; strain; Settore PHYS-03/A - Fisica sperimentale della materia e applicazioni; Settore PHYS-04/A - Fisica teorica della materia; modelli; metodi matematici e applicazioni
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23
von Mica, I. ; Polignano, M. L. ; Mauri, A. G. ; et al.
AIP Conference Proceedings ; page 64-68 ; ISSN 0094-243X
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25
von Polignano, M.L. ; Codegoni, D. ; Castellano, L. ; et al.
Schlagworte: 670
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