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1
von Nayak, Sanjay ; Nallagatla, Venkata Raveendra ; Bisht, Ravindra Singh ; et al.
Schlagworte: Materials Science
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2
von Laurin, L. ; Baldo, M. ; Petroni, E. ; et al.
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-7 Mar, 2023
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3
von Li, Kaiyu ; Jiang, Jiawei ; Codegoni, Andrea ; et al.
Schlagworte: Computer Science - Computer Vision and Pattern Recognition
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4
von Redaelli, A. ; Gandolfo, A. ; Samanni, G. ; et al.
ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2021 - IEEE 51st European. :231-234 Sep, 2021
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5
von Longo, E. ; Markou, A. ; Felser, C. ; et al.
Adv. Funct. Mater. 2024, 2407968
Schlagworte: Condensed Matter - Materials Science
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6
von Tummala, Pinaka Pani ; Afanas’ev, Valeri ; Ferrini, Gabriele ; et al.
In Journal of Electron Spectroscopy and Related Phenomena December 2025 283
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von Redaelli, A. ; Gandolfo, A. ; Samanni, G. ; et al.
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 10:563-568 2022
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8
Schlagworte: Computer Science - Computer Vision and Pattern Recognition; Computer Science - Machine Learning; Electrical Engineering and Systems Science - Image and Video Processing
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9
von Polignano, Maria Luisa ; Codegoni, Davide ; Galbiati, Amos ; et al.
2018 22nd International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2018 22nd International Conference on. :144-152 Sep, 2018
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10
von Ghomi S. ; Martella C. ; Lee Y. ; et al.
Schlagworte: 2D material; conductive AFM; memristor; resistive switching; tellurene; tellurium
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11
von Gennaro, Auricchio ; Andrea, Codegoni ; Stefano, Gualandi ; et al.
Schlagworte: Statistics - Machine Learning; Computer Science - Machine Learning; Mathematics - Optimization and Control; 94A24
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12
von Bellazzi, Riccardo ; Codegoni, Andrea ; Gualandi, Stefano ; et al.
Schlagworte: Quantitative Biology - Genomics; Computer Science - Machine Learning; Mathematics - Optimization and Control; 90C08
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13
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14
von Ghomi, Sara ; Martella, Christian ; Lee, Yoonseok ; et al.
Advanced Science ; volume 12, issue 1 ; ISSN 2198-3844 2198-3844
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15
von Ghomi, Sara ; Grazianetti, Carlo ; Serafini, Andrea ; et al.
Nanoscale Horizons ; volume 10, issue 12, page 3478-3485 ; ISSN 2055-6756 2055-6764
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16
von Auricchio, Gennaro ; Codegoni, Andrea ; Gualandi, Stefano ; et al.
Schlagworte: Mathematics - Optimization and Control; Mathematical Physics; Statistics - Machine Learning; 90C06, 90C08
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17
von Ghidini, Gabriella ; Merlini, Daniele ; Cannavo, Massimiliano ; et al.
2015 45th European Solid State Device Research Conference (ESSDERC) Solid State Device Research Conference (ESSDERC), 2015 45th European. :294-297 Sep, 2015
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18
von Codegoni, Andrea ; Lombardi, Gabriele ; Ferrari, Alessandro
Neural Computing and Applications. 35(11):8471-8486
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von Ghomi, S ; Martella, C ; Lee, Y ; et al.
Schlagworte: 2D material; conductive AFM; memristor; resistive switching; tellurene; tellurium; info:eu-repo/semantics/article
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von Macis, Salvatore ; D'Arco, Annalisa ; Mosesso, Lorenzo ; et al.
Advanced Materials ; volume 36, issue 29 ; ISSN 0935-9648 1521-4095
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von Di Palma, Valerio ; Pianalto, Andrea ; Perego, Michele ; et al.
Schlagworte: atomic layer deposition; IrO; neuroelectronic; pseudocapacitive; Settore PHYS-03/A - Fisica sperimentale della materia e applicazioni; Settore PHYS-04/A - Fisica teorica della materia; modelli; metodi matematici e applicazioni
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von Martella, Christian ; Campi, Davide ; Tummala, Pinaka Pani ; et al.
Schlagworte: 2D material; bending stiffne; interface adhesion; PTAS seeding promoter; strain; Settore PHYS-03/A - Fisica sperimentale della materia e applicazioni; Settore PHYS-04/A - Fisica teorica della materia; modelli; metodi matematici e applicazioni
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von Aureli, I. ; Ventrice, D. ; Codegoni, C. ; et al.
2007 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on. :268-271 Mar, 2007
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