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1
von Mohan, C. ; Crepaldi, M. ; Chiolerio, A.
IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 73(5):3139-3152 May, 2026
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2
von Dai, Ji ; Hellbrück, Lukas ; Puppin, Michele ; et al.
Schlagworte: Strongly Correlated Electrons
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3
von Vietri, A. ; Tortosa, A. ; Ilić, D. ; et al.
Schlagworte: High Energy Astrophysical Phenomena
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4
von Cordier, B. ; Wei, J. Y. ; Zhang, S. N. ; et al.
Schlagworte: High Energy Astrophysical Phenomena; Instrumentation and Methods for Astrophysics
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5
von Götz, D. ; Crepaldi, S. ; Doumayrou, E. ; et al.
Schlagworte: Instrumentation and Methods for Astrophysics; High Energy Astrophysical Phenomena
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6
von Moita, M. ; Meuris, A. ; Ferrando, P. ; et al.
Schlagworte: High Energy Astrophysical Phenomena; Instrumentation and Methods for Astrophysics
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7
von Maggi, P. ; Michel, L. ; Gotz, D. ; et al.
Schlagworte: Instrumentation and Methods for Astrophysics; High Energy Astrophysical Phenomena
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8
von Robinet, F. ; Van Hove, C. ; Moita, M. ; et al.
Schlagworte: Instrumentation and Methods for Astrophysics; High Energy Astrophysical Phenomena
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9
von Berton, M. ; Järvelä, E. ; Chen, S. ; et al.
A&A 708, A46 (2026)
Schlagworte: High Energy Astrophysical Phenomena; Astrophysics of Galaxies
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10
von Cho, Y. ; Motta, E. ; Nocentini, O. ; et al.
IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 25(18):34939-34947 Sep, 2025
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11
von Barba, B. Dalla ; Foschini, L. ; Berton, M. ; et al.
Schlagworte: High Energy Astrophysical Phenomena; Astrophysics of Galaxies
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12
von Barba, B. Dalla ; Foschini, L. ; Berton, M. ; et al.
Schlagworte: Astrophysics of Galaxies; High Energy Astrophysical Phenomena
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13
von Cordier, B. ; Wei, J. Y. ; Tanvir, N. R. ; et al.
Schlagworte: High Energy Astrophysical Phenomena
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14
von Barba, B. Dalla ; Berton, M. ; Foschini, L. ; et al.
Schlagworte: Astrophysics - Astrophysics of Galaxies
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15
von Gatti, G. ; Tancogne-Dejean, N. ; Hübener, H. ; et al.
Phys. Rev. Mater. 8, 125001 (2024)
Schlagworte: Condensed Matter - Materials Science; Condensed Matter - Strongly Correlated Electrons
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16
von Morelli, F. ; Balzarotti, N. ; Guarischi, M. ; et al.
2023 45th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) IEEE Engineering in Medicine & Biology Society (EMBC), 2023 45th Annual International Conference of the. :1-4 Jul, 2023
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17
von Bollini, A. ; Vitali, H. ; Crepaldi, M. ; et al.
2023 45th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) IEEE Engineering in Medicine & Biology Society (EMBC), 2023 45th Annual International Conference of the. :1-5 Jul, 2023
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18
von Vietri, A. ; Berton, M. ; Järvelä, E. ; et al.
A&A 689, A123 (2024)
Schlagworte: Astrophysics - Astrophysics of Galaxies; Astrophysics - High Energy Astrophysical Phenomena
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19
von Caranfil, C. ; Crepaldi, M. ; Marzollo, A. ; et al.
In Autoimmunity Reviews July 2026 25(7)
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20
von Balasubramanian, K.K. ; Salvo, M.D. ; Rocchia, W. ; et al.
IEEE Access Access, IEEE. 12:55925-55944 2024
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21
von Candice C. Morey ; Angela M. AuBuchon ; Meg Attwood ; et al.
Journal of Cognition and Development. 2025 26(1):50-69.
Schlagworte: Elementary School Students; Recall (Psychology); Learning Processes; Priming; Naming; Serial Learning; Serial Ordering; Verbal Stimuli; Repetition; Memorization; Mnemonics; Learning Strategies; Drills (Practice)
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22
von Lo Preti, M. ; Totaro, M. ; Falotico, E. ; et al.
IEEE/ASME Transactions on Mechatronics IEEE/ASME Trans. Mechatron. Mechatronics, IEEE/ASME Transactions on. 27(6):4530-4540 Dec, 2022
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23
von Crepaldi, M. ; Salvo, M.D. ; Merello, A.
IEEE Access Access, IEEE. 11:119898-119932 2023
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24
von Balasubramanian, K.K. ; Diotalevi, F. ; Lorini, C. ; et al.
IEEE Access Access, IEEE. 10:45979-45996 2022
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25
von Schiatti, L. ; Cappagli, G. ; Martolini, C. ; et al.
2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) Engineering in Medicine & Biology Society (EMBC), 2020 42nd Annual International Conference of the IEEE. :3252-3255 Jul, 2020
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